After you enable the working status statistics feature, the feature can help you obtain the working status of a specified instance, product, or device. This way, you can manage and analyze device exceptions in an efficient manner. This topic describes how to view statistics on the working status of IoT Platform resources.
Prerequisites
The working status statistics feature is enabled. For more information, see Enable or disable the O&M statistics feature.
Background information
By default, the O&M statistics feature is disabled for new Enterprise Edition instances. You can enable the feature based on your business requirements. You can also disable the O&M statistics feature that is enabled. The O&M statistics feature provides the device statistics, event statistics, working status statistics, and custom statistics functions.
Procedure
Log on to the IoT Platform console.
In the upper-left corner of the IoT Platform console, select the region in which your Enterprise Edition instance resides. On the Overview tab, find the instance that you want to manage and click the instance name.
In the left-side navigation pane, choose .
Click Working condition statistics. On the Working condition statistics tab, select an instance, product, device, or time range (Any day, Any 7 days, 30d, or All). Then, you can view the working status statistics by instance, product, or device.
View the maximum value, minimum value, and average value of each working status metric for all devices within a specified time range by instance and product. Working status metrics include Online Duration Analysis, Message uplink TPSNumber, Message downlink TPSNumber, Message uplink TPSQuantity, Message downlink TPSQuantity, and Number of connections
You can use the metric cards and line charts of all working status metrics to analyze device status in a comprehensive manner.
You can view the working status of a device within a specified time range.
In a metric-based line chart, you can compare two lines that display the working status of the device and the average value of the metric for all devices of the product to which the device belongs to check whether the device is normal.
