DataWorks Data Modeling provides Metrics to help you build a unified metric system.
Metric system
A metric is a statistical value that measures business characteristics and reflects the status of specific business activities. Metrics are generally categorized as follows:
Atomic Metric: Defines the business statistical scope and calculation rules. Examples include payment amount and number of paying users.
Derived Metric: Consists of an Atomic Metric, a Modifier, and a Time Period. It reflects the status of a business by measuring a target metric across a specific Time Period, Dimension, and business scope. Examples include
payment amount on PC in the last 30 daysandnumber of paying users on PC in the last 30 days.Composite Metric: Created by performing mathematical operations on Derived Metrics or other Composite Metrics. These metrics are used to build complex analytical indicators.
Create an atomic metric. For more information, see Atomic metrics.
Create a modifier. For more information, see Modifier.
Create a time period. For more information, see Period.
Create a derived metric. For more information, see Derived metric.
Create a composite metric. For more information, see Composite metric.
FAQ
Why can't I select a custom Common Layer when creating a metric?
Metrics reside in the Data Warehouse Summary (DWS) layer within the Common Layer or the Application Data Service (ADS) layer within the Application Layer. Consequently, you cannot select other layers.
When can I associate metrics with tables?
When creating a Summary Table or Application Table, you can use Import Metrics to generate metric fields.
Why can atomic metrics only be created in the Common Layer?
Atomic metrics represent abstract concepts derived from Business Processes. For example, the order amount in a payment transaction is an atomic metric.
Why can I select atomic metrics when I create a derived metric in the Application Layer?
A derived metric consists of an atomic metric with added modifiers. Therefore, metrics in the Application Layer are derived from atomic metrics in the Common Layer.